Reliability of vertical-cavity surface-emitting laser arrays with redundancy

This paper describes theoretical reliability analysis of a system containing n optical ports in which each port contains m redundant vertical-cavity surface-emitting lasers. We study the wearout failure statistics, modelled with lognormal distribution, for three different chip-level integration approaches: (A) laser on its own chip, resulting m·n chips, (B) lasers associated one channel are single and (C) all integrated chip. present model that includes run-to-run parameter fluctuation find schemes consistently exhibit MTTF(C) ≥ MTTF(A) MTTF(B) distribution shape parameters observed commercial also provide analytic approximations statistics approaches enabling straightforward calculation any redundancy number.